Design-For-Test For Digital IC's And Embedded Core Systems

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Design-For-Test For Digital IC's And Embedded Core Systems

Alfred Crouch

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Κατηγορίες:

Έτος:

1999

Εκδότης:

Prentice Hall

Γλώσσα:

english

ISBN 10:

0130848271

ISBN 13:

9780130848277

Αρχείο:

PDF, 1.51 MB

IPFS:

,

english, 1999

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Ίσως σας ενδιαφέρει

Bart Broekman, Edwin Notenboom — Testing Embedded Software

Sabih H. Gerez — Algorithms for VLSI Design Automation

Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman — Digital Systems Testing & Testable Design

Zander, Justyna — Model-Based Testing for Embedded Systems

Kim H. Pries, Jon M. Quigley — Testing Complex and Embedded Systems

Eugenio Villar, Maite Veiga (auth.), Juan Carlos López, Román Hermida, Walter Geisselhardt (eds.) — Advanced Techniques for Embedded Systems Design and Test

Zainalabedin Navabi (auth.) — Digital System Test and Testable Design: Using HDL Models and Architectures

Rochit Rajsuman — System-on-a-Chip: Design and Test

Charles E. Stroud (auth.) — A Designer’s Guide to Built-In Self-Test

Rochit Rajsuman — System-on-a-Chip: Design and Test

W. Lam, R. Brayton — Timed Boolean Functions

M. Bushnell, V. Agrawal — Essentials of Electronic Testing - For Digital, Memory and Mixed-Signal VLSI Circuits

Unknown — "Automatic Testing". In: Wiley Encyclopedia of Electrical and Electronics Engineering

M. L. Bushnell and V. D. Agrawal — Solutions to Problems from Essentials of Electronic Testing

2014 — Testing for small-delay defects in nanoscale CMOS integrated circuits

Scheffer L., Lavagno L., Martin G. — EDA for 1C System Design, Verification, and Testing

Frank F. Tsui — Lsi/Vlsi Testability Design

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen — VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

Francis C. Wang — Digital Circuit Testing: A Guide to DFT and Other Techniques

Mark Zwolinski — Digital System Design with Systemverilog (Paperback) (Prentice Hall PTR Signal Integrity Library)

Zwoliński, Mark — Digital system design with SystemVerilog

Hideo Fujiwara — Logic testing and design for testability

Dimitris Gizopoulos — Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)

John G. Webster (Editor) — 13.Computer-Aided Design of Integrated Circuits

Alexander Miczo — Digital Logic Testing and Simulation

N. K. Jha, S. Gupta — Testing of Digital Systems

J B Gosling — Simulation in the design of digital electronic systems

John B. Gosling — Simulation in the Design of Digital Electronic Systems

M. Bushnell; Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Benoit Nadeau-Dostie — Design for AT-Speed Test, Diagnosis and Measurement

M. Bushnell, Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Louis Scheffer, Luciano Lavagno, Grant Martin — EDA for IC System Design, Verification, and Testing (Electronic Design Automation for Integrated Circuits Hdbk)

Hurst, Stanley Leonard — VLSI testing : digital and mixed analogue/digital techniques

Douglas J. Smith — Hdl Chip Design: A Practical Guide for Designing, Synthesizing & Simulating Asics & Fpgas Using Vhdl or Verilog

Dimitris Gizopoulos, Antonis Paschalis, Yervant Zorian (auth.) — Embedded Processor-Based Self-Test

Charles E. Stroud — A Designer s Guide to Built-in Self-Test

Sandeep K. Goel, Krishnendu Chakrabarty — Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Laung-Terng Wang, Charles E. Stroud (auth.), Patrick Girard, Nicola Nicolici, Xiaoqing Wen (eds.) — Power-Aware Testing and Test Strategies for Low Power Devices

Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty (auth.) — Test and Diagnosis for Small-Delay Defects

Gert Jervan. — Hybrid built-in self-test and test generation techniques for digital systems

S. Jayanthy, M.C. Bhuvaneswari — Test Generation of Crosstalk Delay Faults in VLSI Circuits

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